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    Bistable nanoelectromechanical devices

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    A combined transmission electron microscopy-scanning tunneling microscopy (TEM-STM) technique has been used to investigate the force interactions of silicon and germanium nanowires with gold electrodes. The I(V) data obtained typically show linear behavior between the gold electrode and silicon nanowires at all contact points, whereas the linearity of I(V) curves obtained for germanium nanowires were dependent on the point of contact. Bistable silicon and germanium nanowire-based nanoelectromechanical programmable read-only memory (NEMPROM) devices were demonstrated by TEM-STM. These nonvolatile NEMPROM devices have switching potentials as low as 1 V and are highly stable making them ideal candidates for low-leakage electronic devices.

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    Description

    Title : Bistable nanoelectromechanical devices
    Author(s) : Kirk J Ziegler, Daniel M Lyons, Justin D Holmes, Donats Erts, Boris Polyakov, Hakan Olin, Krister Svensson, Eva Olsson
    Abstract : A combined transmission electron microscopy-scanning tunneling microscopy (TEM-STM) technique has been used to investigate the force interactions of silicon and germanium nanowires with gold electrodes. The I(V) data obtained typically show linear behavior between the gold electrode and silicon nanowires at all contact points, whereas the linearity of I(V) curves obtained for germanium nanowires were dependent on the point of contact. Bistable silicon and germanium nanowire-based nanoelectromechanical programmable read-only memory (NEMPROM) devices were demonstrated by TEM-STM. These nonvolatile NEMPROM devices have switching potentials as low as 1 V and are highly stable making them ideal candidates for low-leakage electronic devices.
    Keywords : elemental semiconductors, eprom, germanium, micromechanical devices, nanoelectronics, nanowires, point contacts, scanning tunnelling microscopy, silicon, transmission electron microscopy

    Subject : unspecified
    Area : Other
    Language : English
    Year : 2004

    Affiliations Mid Sweden University
    Journal : Applied Physics Letters
    Volume : 84
    Issue : 20
    Publisher : AIP
    Pages : 4074-4076
    Url : http://link.aip.org/link/?APL/84/4074/1

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    Hakan's Peer Evaluation activity

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